Read e-book online Aberration-corrected Analytical Electron Microscopy (RMS - PDF

By Rik Brydson

ISBN-10: 0470518510

ISBN-13: 9780470518519

The publication is worried with the idea, heritage, and useful use of transmission electron microscopes with lens correctors that could right the consequences of round aberration. The ebook additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technology and biology. This booklet is key for microscopists desirous about nanoscale and fabrics microanalysis specially these utilizing scanning transmission electron microscopy, and comparable analytical options comparable to electron diffraction x-ray spectrometry (EDXS) and electron power loss spectroscopy (EELS).

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Hence thermionic emitters are not suitable for use with high energy resolution EEL spectrometry for example, where we require the energy resolution to be ca. 3 eV. If a large total beam current is a high priority, for EDX analysis, for example, one alternative is the use of a LaB6 pointed cathode, which is heated indirectly. This has the advantage of a factor of times 10 increase in beam brightness and beam current, with a slightly reduced energy spread. 5 eV with a high beam coherence, a cold field emission tip is usually required.

F. (1996) Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press: New York. F. Li, P. and Malac, M. (2004) Radiation damage in the TEM and SEM, Micron 35, 399–409. Goldstein, J. , Sawyer, L. R. (2003) Scanning Electron Microscopy and X-ray Microanalysis, Springer. J. and Beanland, R. (2001) Electron Microscopy and Analysis. Taylor and Francis. W. ) (2008) Advances in Imaging and Electron Physics, Vol. 153, Elsevier. J. (1998) Advanced Computing in Electron Microscopy, Plenum Press, New York.

9), the source of the electron beam is almost of millimetre dimensions, and must be hugely demagnified if a beam of nanometre dimensions is to be obtained. 10), where the source of the current is of atomic dimensions. But such guns, based on electron tunneling, require upgrading the vacuum system of DEVELOPMENT OF STEM 41 microscopes to ultra-high-vacuum (UHV) standards, technically very difficult and costly. 2 THE CREWE REVOLUTION: HOW STEM SOLVES THE INFORMATION PROBLEM The first implementation of point-by-point acquisition of spectra and the imaging of individual atoms on a substrate was carried out by Albert Victor Crewe (Crewe, 1971) in 1970.

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Aberration-corrected Analytical Electron Microscopy (RMS - Royal Microscopical Society) by Rik Brydson

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